ANALYSIS: IMPACT OF IMAGE MATCHING METHODS ON JITTER COMPENSATION
G. Ye,J. Pan,M. Wang,Y. Zhu,and S. Jin
G. Ye
State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan 430079, China
J. Pan
State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan 430079, China
M. Wang
State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan 430079, China
Y. Zhu
School of Electrical and Information Engineering, Hubei Key Laboratory of Optical Information and Pattern Recognition, Wuhan Institute of Technology, Wuhan 430205, China
S. Jin
State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan 430079, China
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